Volume 38; Issue 11

Microelectronics Reliability

Volume 38; Issue 11

1

ESD protection in thin film silicon on insulator technologies

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 925 KB

english, 1998

2

ESD protection techniques for high frequency integrated circuits

G. Croft, J. Bernier

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 254 KB

english, 1998

3

ESD failure analysis methodology

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 321 KB

english, 1998

4

ESD laboratory simulations and signature analysis of a CMOS programmable logic product

L.G. Henry, T. Raymond, M. Mahanpour, I. Morgan

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 422 KB

english, 1998

5

Study of the ESD behavior of different clamp configurations in a 0.35 μm CMOS technology

C Richier, N Maene, G Mabboux, R Bellens

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 344 KB

english, 1998

6

On the use of n-well resistors in ESD protections

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 573 KB

english, 1998

7

Does the ESD-failure current obtained by transmission-line pulsing always correlate to human body model tests?

W Stadler, X Guggenmos, P Egger, H Gieser, C Musshoff

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 661 KB

english, 1998

8

Editorial

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 79 KB

english, 1998

9

The impact of MOSFET technology evolution and scaling on electrostatic discharge protection

Steven H Voldman

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 1.86 MB

english, 1998

10

Designing power supply clamps for electrostatic discharge protection of integrated circuits

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 395 KB

english, 1998

11

ESD robustness prediction and protection device design in partially depleted SOI technology

P. Raha, J.C. Smith, J.W. Miller, E. Rosenbaum

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 748 KB

english, 1998

12

Unique ESD failure mechanisms during negative to Vcc HBM tests

M Chaine, S Smith, A Bui

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 906 KB

english, 1998

13

An attempt to explain thermally induced soft failures during low level ESD stresses: study of the differences between soft and hard NMOS failures

P. Salome, C. Leroux, D. Mariolle, D. Lafond, J.P. Chante, P. Crevel, G. Reimbold

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 533 KB

english, 1998

14

ESD issues in compound semiconductor high-frequency devices and circuits

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 1.56 MB

english, 1998

15

Novel concept for high level overdrive tolerance of GaAs based FETs

K.M Lipka, P Schmid, M Birk, M Demmler, J Schneider, B Splingart, P.J Tasker, H Heinecke, E Kohn

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 536 KB

english, 1998