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Volume 38; Issue 11
Main
Microelectronics Reliability
Volume 38; Issue 11
Microelectronics Reliability
Volume 38; Issue 11
1
ESD protection in thin film silicon on insulator technologies
J.C Smith
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 925 KB
Your tags:
english, 1998
2
ESD protection techniques for high frequency integrated circuits
G. Croft
,
J. Bernier
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 254 KB
Your tags:
english, 1998
3
ESD failure analysis methodology
J Colvin
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 321 KB
Your tags:
english, 1998
4
ESD laboratory simulations and signature analysis of a CMOS programmable logic product
L.G. Henry
,
T. Raymond
,
M. Mahanpour
,
I. Morgan
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 422 KB
Your tags:
english, 1998
5
Study of the ESD behavior of different clamp configurations in a 0.35 μm CMOS technology
C Richier
,
N Maene
,
G Mabboux
,
R Bellens
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 344 KB
Your tags:
english, 1998
6
On the use of n-well resistors in ESD protections
G. Notermans
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 573 KB
Your tags:
english, 1998
7
Does the ESD-failure current obtained by transmission-line pulsing always correlate to human body model tests?
W Stadler
,
X Guggenmos
,
P Egger
,
H Gieser
,
C Musshoff
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 661 KB
Your tags:
english, 1998
8
Editorial
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 79 KB
Your tags:
english, 1998
9
The impact of MOSFET technology evolution and scaling on electrostatic discharge protection
Steven H Voldman
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 1.86 MB
Your tags:
english, 1998
10
Designing power supply clamps for electrostatic discharge protection of integrated circuits
T.J. Maloney
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 395 KB
Your tags:
english, 1998
11
ESD robustness prediction and protection device design in partially depleted SOI technology
P. Raha
,
J.C. Smith
,
J.W. Miller
,
E. Rosenbaum
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 748 KB
Your tags:
english, 1998
12
Unique ESD failure mechanisms during negative to Vcc HBM tests
M Chaine
,
S Smith
,
A Bui
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 906 KB
Your tags:
english, 1998
13
An attempt to explain thermally induced soft failures during low level ESD stresses: study of the differences between soft and hard NMOS failures
P. Salome
,
C. Leroux
,
D. Mariolle
,
D. Lafond
,
J.P. Chante
,
P. Crevel
,
G. Reimbold
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 533 KB
Your tags:
english, 1998
14
ESD issues in compound semiconductor high-frequency devices and circuits
K. Bock
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 1.56 MB
Your tags:
english, 1998
15
Novel concept for high level overdrive tolerance of GaAs based FETs
K.M Lipka
,
P Schmid
,
M Birk
,
M Demmler
,
J Schneider
,
B Splingart
,
P.J Tasker
,
H Heinecke
,
E Kohn
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 536 KB
Your tags:
english, 1998
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