Degradation of electron irradiated MOS capacitors
A. Candelori, A. Paccagnella, A. Scarpa, G. Ghidini, P.G. FuochiVolume:
39
Year:
1999
Language:
english
Pages:
7
DOI:
10.1016/s0026-2714(98)00231-5
File:
PDF, 202 KB
english, 1999