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Investigations on the thermal behavior of interconnects under ESD transients using a simplified thermal RC network
Pascal Salome, Charles Leroux, Philippe Crevel, Jean Pierre ChanteVolume:
39
Year:
1999
Language:
english
Pages:
13
DOI:
10.1016/s0026-2714(99)00073-6
File:
PDF, 269 KB
english, 1999