DC and pulsed measurements of on-state breakdown voltage in...

Microelectronics Reliability 1999 Vol. 39; Iss. 12

DC and pulsed measurements of on-state breakdown voltage in GaAs MESFETs and InP-based HEMTs

Gaudenzio Meneghesso, Giovanni Massari, Dario Buttari, Andrea Bortoletto, Massimo Maretto, Enrico Zanoni
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Volume:
39
Year:
1999
Language:
english
Pages:
5
DOI:
10.1016/s0026-2714(99)00182-1
File:
PDF, 154 KB
english, 1999
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