Reliability investigation of InGaP/GaAs HBTs under current and temperature stress
A.A. Rezazadeh, S.A. Bashar, H. Sheng, F.A. Amin, A.H. Khalid, M. Sotoodeh, M.A. Crouch, L. Cattani, F. Fantini, J.J. LiouVolume:
39
Year:
1999
Language:
english
Pages:
8
DOI:
10.1016/s0026-2714(99)00189-4
File:
PDF, 249 KB
english, 1999