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The influence of stud bumping stress on device degradation in scaled MOSFETs
Nobuhiro Shimoyama, Katsuyuki Machida, Masakazu Shimaya, Hiroshi Koizumi, Hakaru KyuragiVolume:
40
Year:
2000
Language:
english
Pages:
9
DOI:
10.1016/s0026-2714(99)00218-8
File:
PDF, 1.31 MB
english, 2000