Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations
A.J Mouthaan, C Salm, M.M Lunenborg, M.A.R.C de Wolf, F.G KuperVolume:
40
Year:
2000
Language:
english
Pages:
9
DOI:
10.1016/s0026-2714(99)00252-8
File:
PDF, 618 KB
english, 2000