Volume 40; Issue 6

Microelectronics Reliability

Volume 40; Issue 6

1

Characterization of high-density current stressed IGBTs and simulation with an adapted SPICE sub-circuit

A Maouad, A Hoffmann, A Khoury, J.-P Charles

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 311 KB

english, 2000

2

Comments on “Reliability and component importance of a consecutive-k-out-of-n system” by Zuo

Frank K. Hwang, Lirong Cui, Jen-Chun Chang, Wen-Dar Lin

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 69 KB

english, 2000

3

Mechanisms of noise sources in microelectromechanical systems

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 363 KB

english, 2000

4

Module allocation for on-line testing

A.A Ismaeel, R Mathew, R Bhatnagar

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 463 KB

english, 2000

5

Properties of laser cut LTCC heaters

Jaroslaw Kita, Andrzej Dziedzic, Leszek J Golonka, Andrzej Bochenek

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 300 KB

english, 2000

6

Backside probing of flip–chip circuits using electrostatic force sampling

R Qi, D.J Thomson, G.E Bridges

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 507 KB

english, 2000

7

Computationally efficient large-change statistical analysis of linear electronic circuits

T. Ilić, V.B. Litovski, I.V. Litovski, S. Stojiljković

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 1.20 MB

english, 2000

8

High performance a-Si:H thin film transistors based on aluminum gate metallization

A Nathan, R.V.R Murthy, B Park, S.G Chamberlain

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 1.41 MB

english, 2000

9

Design-for-test for Digital ICs and Embedded Core Systems; Alfred L. Crouch. Prentice Hall, Inc., Upper Saddle River, NJ, 07458, hardcover, p. 349, CD ROM included, ISBN: 0-13-084827-1, $80,50.

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 48 KB

english, 2000

10

Electrical stress and plasma-induced traps in SiO2

A. Paskaleva, E. Atanassova

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 202 KB

english, 2000

11

Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations

A.J Mouthaan, C Salm, M.M Lunenborg, M.A.R.C de Wolf, F.G Kuper

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 618 KB

english, 2000

12

Predictive densities for the lognormal distribution and their applications

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 148 KB

english, 2000

13

An efficient approach to the measurement and characterization of MOSFET capacitances

M Sadowski, D Tomaszewski

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 669 KB

english, 2000

14

A new method of studying on the dynamic parameters of bulk traps in thin SiO2 layer of MOS structures

Xie Bing, He Yandong, Xu Mingzhen, Tan Changhua

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 104 KB

english, 2000

15

Validation of bulk-charge effect parameter extraction in MOSFETs

F.J Garcı́a Sánchez, A Ortiz-Conde, J.A Salcedo, J Muci, M Estrada, A Cerdeira, J.J Liou, Y Yue

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 168 KB

english, 2000

16

Second-layer polysilicon structures for gate end-around leakage-current compensation in bulk CMOS ICs

Douglas J Fouts, Gary R McKerrow, Gary K Lum, Sidney S Noe, Andrew S Lambley

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 541 KB

english, 2000

17

Modeling early failure in integrated circuit interconnect

Daniel Tekleab, K.F Poole, R Singh, D.L Carroll, W.R Harrell

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 129 KB

english, 2000

18

The evolution of the resistance of aluminum interconnects during electromigration

Jonathan C. Doan, John C. Bravman, Paul A. Flinn, Thomas N. Marieb

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 577 KB

english, 2000

19

Current reliability issues and future technologies for systems on silicon – processes, circuits, chip architecture, and design

Eiji Takeda, Takao Watanabe, Shinichiro Kimura, Jiro Yugami, Keiichi Haraguchi, Kei Suzuki, Katsuro Sasaki

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 1.85 MB

english, 2000

20

New challenges to the modelling and electrical characterisation of ohmic contacts for ULSI devices

A.S Holland, G.K Reeves

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 1.06 MB

english, 2000

21

High Performance Cluster Computing vol. I & II; Rajkumar Buyya ed. Prentice Hall PTR, Upper Saddle River, NJ 07458, 1999, Hardcover, vol. I. p. 849, $55.50, vol. II, p. 664, $55.50, ISBN: 0-13-013784-7 for vol. I, 0-13-013785-5 for vol. II

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 46 KB

english, 2000

22

Logic and Computer Design Fundamentals; 2 ed.; Morris Mans, Charles Kime. Prentice Hall, Inc., Upper Saddle River, NJ, 07458, 2000, paperbound, p. 652, CD ROMs included, ISBN: 0-13-016176-4, $48.99.

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 53 KB

english, 2000