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Volume 40; Issue 6
Main
Microelectronics Reliability
Volume 40; Issue 6
Microelectronics Reliability
Volume 40; Issue 6
1
Characterization of high-density current stressed IGBTs and simulation with an adapted SPICE sub-circuit
A Maouad
,
A Hoffmann
,
A Khoury
,
J.-P Charles
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 311 KB
Your tags:
english, 2000
2
Comments on “Reliability and component importance of a consecutive-k-out-of-n system” by Zuo
Frank K. Hwang
,
Lirong Cui
,
Jen-Chun Chang
,
Wen-Dar Lin
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 69 KB
Your tags:
english, 2000
3
Mechanisms of noise sources in microelectromechanical systems
Zoran Djurić
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 363 KB
Your tags:
english, 2000
4
Module allocation for on-line testing
A.A Ismaeel
,
R Mathew
,
R Bhatnagar
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 463 KB
Your tags:
english, 2000
5
Properties of laser cut LTCC heaters
Jaroslaw Kita
,
Andrzej Dziedzic
,
Leszek J Golonka
,
Andrzej Bochenek
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 300 KB
Your tags:
english, 2000
6
Backside probing of flip–chip circuits using electrostatic force sampling
R Qi
,
D.J Thomson
,
G.E Bridges
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 507 KB
Your tags:
english, 2000
7
Computationally efficient large-change statistical analysis of linear electronic circuits
T. Ilić
,
V.B. Litovski
,
I.V. Litovski
,
S. Stojiljković
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 1.20 MB
Your tags:
english, 2000
8
High performance a-Si:H thin film transistors based on aluminum gate metallization
A Nathan
,
R.V.R Murthy
,
B Park
,
S.G Chamberlain
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 1.41 MB
Your tags:
english, 2000
9
Design-for-test for Digital ICs and Embedded Core Systems; Alfred L. Crouch. Prentice Hall, Inc., Upper Saddle River, NJ, 07458, hardcover, p. 349, CD ROM included, ISBN: 0-13-084827-1, $80,50.
M Stojcev
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 48 KB
Your tags:
english, 2000
10
Electrical stress and plasma-induced traps in SiO2
A. Paskaleva
,
E. Atanassova
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 202 KB
Your tags:
english, 2000
11
Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations
A.J Mouthaan
,
C Salm
,
M.M Lunenborg
,
M.A.R.C de Wolf
,
F.G Kuper
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 618 KB
Your tags:
english, 2000
12
Predictive densities for the lognormal distribution and their applications
Zhenlin Yang
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 148 KB
Your tags:
english, 2000
13
An efficient approach to the measurement and characterization of MOSFET capacitances
M Sadowski
,
D Tomaszewski
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 669 KB
Your tags:
english, 2000
14
A new method of studying on the dynamic parameters of bulk traps in thin SiO2 layer of MOS structures
Xie Bing
,
He Yandong
,
Xu Mingzhen
,
Tan Changhua
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 104 KB
Your tags:
english, 2000
15
Validation of bulk-charge effect parameter extraction in MOSFETs
F.J Garcı́a Sánchez
,
A Ortiz-Conde
,
J.A Salcedo
,
J Muci
,
M Estrada
,
A Cerdeira
,
J.J Liou
,
Y Yue
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 168 KB
Your tags:
english, 2000
16
Second-layer polysilicon structures for gate end-around leakage-current compensation in bulk CMOS ICs
Douglas J Fouts
,
Gary R McKerrow
,
Gary K Lum
,
Sidney S Noe
,
Andrew S Lambley
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 541 KB
Your tags:
english, 2000
17
Modeling early failure in integrated circuit interconnect
Daniel Tekleab
,
K.F Poole
,
R Singh
,
D.L Carroll
,
W.R Harrell
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 129 KB
Your tags:
english, 2000
18
The evolution of the resistance of aluminum interconnects during electromigration
Jonathan C. Doan
,
John C. Bravman
,
Paul A. Flinn
,
Thomas N. Marieb
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 577 KB
Your tags:
english, 2000
19
Current reliability issues and future technologies for systems on silicon – processes, circuits, chip architecture, and design
Eiji Takeda
,
Takao Watanabe
,
Shinichiro Kimura
,
Jiro Yugami
,
Keiichi Haraguchi
,
Kei Suzuki
,
Katsuro Sasaki
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 1.85 MB
Your tags:
english, 2000
20
New challenges to the modelling and electrical characterisation of ohmic contacts for ULSI devices
A.S Holland
,
G.K Reeves
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 1.06 MB
Your tags:
english, 2000
21
High Performance Cluster Computing vol. I & II; Rajkumar Buyya ed. Prentice Hall PTR, Upper Saddle River, NJ 07458, 1999, Hardcover, vol. I. p. 849, $55.50, vol. II, p. 664, $55.50, ISBN: 0-13-013784-7 for vol. I, 0-13-013785-5 for vol. II
M Stojcev
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 46 KB
Your tags:
english, 2000
22
Logic and Computer Design Fundamentals; 2 ed.; Morris Mans, Charles Kime. Prentice Hall, Inc., Upper Saddle River, NJ, 07458, 2000, paperbound, p. 652, CD ROMs included, ISBN: 0-13-016176-4, $48.99.
M Stojcev
Journal:
Microelectronics Reliability
Year:
2000
Language:
english
File:
PDF, 53 KB
Your tags:
english, 2000
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