A 3 Dimensional Built-In Self-Repair Scheme for Yield...

IEEE Transactions on Reliability 2015 / 6 Vol. 64; Iss. 2

A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories

Kang, Wooheon, Lee, Changwook, Lim, Hyunyul, Kang, Sungho
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2015.2410274
Date:
June, 2015
File:
PDF, 1.03 MB
english, 2015
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