Volume 64; Issue 2

IEEE Transactions on Reliability

Volume 64; Issue 2

1

Goodness of Fit Using a New Estimate of Kullback-Leibler Information Based on Type II Censored Data

Alizadeh Noughabi, Hadi, Balakrishnan, Narayanaswamy

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.69 MB

english, 2015

2

Real-Time Prognosis of Crack Growth Evolution Using Sequential Monte Carlo Methods and Statistical Model Parameters

Corbetta, Matteo, Sbarufatti, Claudio, Manes, Andrea, Giglio, Marco

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 4.10 MB

english, 2015

3

A Prognostic-Information-Based Order-Replacement Policy for a Non-Repairable Critical System in Service

Wang, Zhao-Qiang, Wang, Wenbin, Hu, Chang-Hua, Si, Xiao-Sheng, Zhang, Wei

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.25 MB

english, 2015

4

Non-Homogeneous 1-Out-of-${N}$ Warm Standby Systems With Random Replacement Times

Levitin, Gregory, Xing, Liudong, Dai, Yuanshun

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.40 MB

english, 2015

5

Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon

Ghoneim, Mohamed T., Rojas, Jhonathan P., Young, Chadwin D., Bersuker, Gennadi, Hussain, Muhammad M.

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.35 MB

english, 2015

6

Computing the Signature of a Generalized $k$ -Out-of-$n$ System

Eryilmaz, Serkan, Tuncel, Altan

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.22 MB

english, 2015

7

Statistical Inference of Component Lifetimes With Location-Scale Distributions From Censored System Failure Data With Known Signature

Zhang, Jian, Ng, Hon Keung Tony, Balakrishnan, Narayanaswamy

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.93 MB

english, 2015

8

Uncertainty Importance Measure of Individual Components in Multi-State Systems

Wang, Yong, Li, Lin

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.93 MB

english, 2015

9

Soft Error Hardened Memory Design for Nanoscale Complementary Metal Oxide Semiconductor Technology

Guo, Jing, Xiao, Liyi, Wang, Tianqi, Liu, Shanshan, Wang, Xu, Mao, Zhigang

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 732 KB

english, 2015

10

Mixture Representations for Three-State Systems With Three-State Components

Eryilmaz, Serkan

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.24 MB

english, 2015

11

Particle-Filtering-Based Discharge Time Prognosis for Lithium-Ion Batteries With a Statistical Characterization of Use Profiles

Pola, Daniel A., Navarrete, Hugo F., Orchard, Marcos E., Rabie, Ricardo S., Cerda, Matias A., Olivares, Benjamin E., Silva, Jorge F., Espinoza, Pablo A., Perez, Aramis

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.23 MB

english, 2015

12

IEEE Transactions on Reliability institutional listings

Journal:

IEEE Transactions on Reliability

Year:

2015

File:

PDF, 789 KB

2015

13

Genetic Algorithms in the Framework of Dempster-Shafer Theory of Evidence for Maintenance Optimization Problems

Compare, Michele, Zio, Enrico

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.95 MB

english, 2015

14

IEEE Transactions on Reliability publication information

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 133 KB

english, 2015

15

A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories

Kang, Wooheon, Lee, Changwook, Lim, Hyunyul, Kang, Sungho

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.03 MB

english, 2015

16

Some Insights Into the Effect of Maintenance Quality for a Protection System

Berrade, M. D., Scarf, Philip A., Cavalcante, Cristiano A. V.

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.44 MB

english, 2015

17

So Where Are We? A Guest Opinion Editorial

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 107 KB

english, 2015

18

Joint Reliability Importance in a Consecutive- $k$ -out-of-$n$ :F System and an $m$-Consecutive- $k$-out-of-$n$:F System for Markov-Dependent Components

Zhu, Xiaoyan, Boushaba, Mahmoud, Reghioua, Mohamed

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 3.42 MB

english, 2015

19

The Robust Cold Standby Redundancy Allocation in Series-Parallel Systems With Budgeted Uncertainty

Feizollahi, Mohammad Javad, Soltani, Roya, Feyzollahi, Hadi

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.30 MB

english, 2015

20

Information-Theoretic Measures and Sequential Monte Carlo Methods for Detection of Regeneration Phenomena in the Degradation of Lithium-Ion Battery Cells

Orchard, Marcos E., Lacalle, Matias S., Olivares, Benjamin E., Silva, Jorge F., Palma-Behnke, Rodrigo, Estevez, Pablo A., Severino, Bernardo, Calderon-Munoz, Williams, Cortes-Carmona, Marcelo

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 752 KB

english, 2015

21

A Visual Interactive Method for Prime Implicants Identification

Di Maio, Francesco, Baronchelli, Samuele, Zio, Enrico

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.49 MB

english, 2015

22

IEEE Transactions on Reliability institutional listings

Journal:

IEEE Transactions on Reliability

Year:

2015

File:

PDF, 1.23 MB

2015

23

Parameter Inference in a Hybrid System With Masked Data

Wang, Ronghua, Sha, Naijun, Gu, Beiqing, Xu, Xiaoling

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.35 MB

english, 2015

24

The Reliability of Subgraphs in the Arrangement Graph

Lin, Limei, Xu, Li, Zhou, Shuming, Wang, Dajin

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 3.16 MB

english, 2015

25

IEEE Transactions on Reliability information for authors

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 165 KB

english, 2015

26

Remaining Useful Life Prediction for a Nonlinear Heterogeneous Wiener Process Model With an Adaptive Drift

Huang, Zeyi, Xu, Zhengguo, Wang, Wenhai, Sun, Youxian

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.40 MB

english, 2015

27

Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process

Tsai, Chih-Chun, Lin, Chien-Tai, Balakrishnan, Narayanaswamy

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.98 MB

english, 2015

28

Table of Contents

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 65 KB

english, 2015

29

Semi-Markov Process-Based Integrated Importance Measure for Multi-State Systems

Dui, Hongyan, Si, Shubin, Zuo, Ming J., Sun, Shudong

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 3.40 MB

english, 2015

30

An Integrated Prognostics Method Under Time-Varying Operating Conditions

Zhao, Fuqiong, Tian, Zhigang, Bechhoefer, Eric, Zeng, Yong

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.71 MB

english, 2015

31

Organizational Reliability Capability Assessment: A Case Study in China R&D Enterprise for Aviation Products

Pan, Xing, Xin, Ziling, Li, Guosheng

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.80 MB

english, 2015

32

A New Class of Markovian Processes for Deteriorating Units With State Dependent Increments and Covariates

Giorgio, Massimiliano, Guida, Maurizio, Pulcini, Gianpaolo

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 3.11 MB

english, 2015