Ultra-thin SiO2 film studies: index, thickness, roughness...

Ultra-thin SiO2 film studies: index, thickness, roughness and the initial oxidation regime

Eugene A. Irene
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Volume:
45
Year:
2001
Language:
english
Pages:
11
DOI:
10.1016/s0038-1101(00)00258-6
File:
PDF, 469 KB
english, 2001
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