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Time decay of stress induced leakage current in thin gate oxides by low-field electron injection
A Cester, A Paccagnella, G GhidiniVolume:
45
Year:
2001
Language:
english
Pages:
9
DOI:
10.1016/s0038-1101(00)00264-1
File:
PDF, 476 KB
english, 2001