Experimental study of the current characteristics of thin...

Experimental study of the current characteristics of thin silicon oxide films under dynamic stress

J.-W Zahlmann-Nowitzki, L Nebrich, P Seegebrecht
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Year:
2001
Language:
english
Pages:
8
DOI:
10.1016/s0038-1101(00)00269-0
File:
PDF, 205 KB
english, 2001
Conversion to is in progress
Conversion to is failed