Growth and characterization of epitaxial ferroelectric...

Solid-State Electronics 2001 Vol. 45; Iss. 8

Growth and characterization of epitaxial ferroelectric PbZrxTi1−xO3 thin film capacitors with SrRuO3 electrodes for non-volatile memory applications

C. Guerrero, J. Roldán, C. Ferrater, M.V. Garcia-Cuenca, F. Sánchez, M. Varela
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Volume:
45
Year:
2001
Language:
english
Pages:
8
DOI:
10.1016/s0038-1101(00)00275-6
File:
PDF, 465 KB
english, 2001
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