Evolution from soft to hard breakdown in thin gate oxides:...

Evolution from soft to hard breakdown in thin gate oxides: effect of oxide thickness, capacitor area and stress current

A Cacciato, S Evseev, H Valk
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Year:
2001
Language:
english
Pages:
6
DOI:
10.1016/s0038-1101(01)00067-3
File:
PDF, 229 KB
english, 2001
Conversion to is in progress
Conversion to is failed