Transport mechanisms and charge trapping in thin...

Transport mechanisms and charge trapping in thin dielectric/Si nano-crystals structures

B. De Salvo, G. Ghibaudo, P. Luthereau, T. Baron, B. Guillaumot, G. Reimbold
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Volume:
45
Year:
2001
Language:
english
Pages:
7
DOI:
10.1016/s0038-1101(01)00070-3
File:
PDF, 344 KB
english, 2001
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