Low voltage and temperature effects on SILC in stressed...

Solid-State Electronics 2001 Vol. 45; Iss. 8

Low voltage and temperature effects on SILC in stressed ultrathin oxide films

A Meinertzhagen, D Zander, C Petit, M Jourdain, D Gogenheim
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Year:
2001
Language:
english
Pages:
11
DOI:
10.1016/s0038-1101(01)00071-5
File:
PDF, 258 KB
english, 2001
Conversion to is in progress
Conversion to is failed