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Electrical characterization and modeling of MOS structures with an ultra-thin oxide
R. Clerc, B. De Salvo, G. Ghibaudo, G. Reimbold, G. PananakakisVolume:
46
Year:
2002
Language:
english
Pages:
10
DOI:
10.1016/s0038-1101(01)00113-7
File:
PDF, 282 KB
english, 2002