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A recombination- and trap-assisted tunneling model for stress-induced leakage current
Daniele Ielmini, Alessandro S. Spinelli, Andrea L. Lacaita, Andrea Martinelli, Gabriella GhidiniVolume:
45
Year:
2001
Language:
english
Pages:
9
DOI:
10.1016/s0038-1101(01)00173-3
File:
PDF, 217 KB
english, 2001