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Modeling of abnormal capacitance–voltage characteristics observed in MOS transistor with ultra-thin gate oxide
Yung-Lung Hsu, Yean-Kuen Fang, Feng-Cherng Tsao, Fu-Jung Kuo, Yens HoVolume:
46
Year:
2002
Language:
english
Pages:
3
DOI:
10.1016/s0038-1101(02)00124-7
File:
PDF, 116 KB
english, 2002