Interplay of voltage and temperature acceleration of oxide...

Interplay of voltage and temperature acceleration of oxide breakdown for ultra-thin gate oxides

E Wu, J Suñé, W Lai, E Nowak, J McKenna, A Vayshenker, D Harmon
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Volume:
46
Year:
2002
Language:
english
Pages:
12
DOI:
10.1016/s0038-1101(02)00151-x
File:
PDF, 339 KB
english, 2002
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