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Static and low frequency noise characterization in surface- and buried-mode 0.1 μm PMOSFETS
M. Fadlallah, G. Ghibaudo, J. Jomaah, G. GuéganVolume:
47
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0038-1101(03)00047-9
File:
PDF, 391 KB
english, 2003