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Low frequency current noise in 2.5 nm MOSFET and fractal dimension of soft breakdown
Zongliang Huo, Lingfeng Mao, Mingzhen Xu, Changhua TanVolume:
47
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0038-1101(03)00096-0
File:
PDF, 207 KB
english, 2003