Low frequency current noise in 2.5 nm MOSFET and fractal...

Low frequency current noise in 2.5 nm MOSFET and fractal dimension of soft breakdown

Zongliang Huo, Lingfeng Mao, Mingzhen Xu, Changhua Tan
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Volume:
47
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0038-1101(03)00096-0
File:
PDF, 207 KB
english, 2003
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