A review of leakage current in SOI CMOS ICs: impact on...

Solid-State Electronics 2003 Vol. 47; Iss. 11

A review of leakage current in SOI CMOS ICs: impact on parametric testing techniques

Benjamı́n Iñı́guez, Jean-Pierre Raskin, Pascal Simon, Denis Flandre, Jaume Segura
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Volume:
47
Year:
2003
Language:
english
Pages:
9
DOI:
10.1016/s0038-1101(03)00249-1
File:
PDF, 177 KB
english, 2003
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