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A new procedure to extract the threshold voltage of MOSFETs using noise-reduction techniques
R. Picos, M. Roca, B. Iñı́guez, E. Garcı́a-MorenoVolume:
47
Year:
2003
Language:
english
Pages:
6
DOI:
10.1016/s0038-1101(03)00252-1
File:
PDF, 138 KB
english, 2003