Source-drain burnout mechanism of GaAs power MESFETS: Three terminal effects
Saburo Takamiya, Takuji Sonoda, Masahide Yamanouchi, Takashi Fujioka, Masaki KohnoVolume:
41
Year:
1997
Language:
english
Pages:
9
DOI:
10.1016/s0038-1101(96)00147-5
File:
PDF, 906 KB
english, 1997