Source-drain burnout mechanism of GaAs power MESFETS: Three...

Source-drain burnout mechanism of GaAs power MESFETS: Three terminal effects

Saburo Takamiya, Takuji Sonoda, Masahide Yamanouchi, Takashi Fujioka, Masaki Kohno
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Volume:
41
Year:
1997
Language:
english
Pages:
9
DOI:
10.1016/s0038-1101(96)00147-5
File:
PDF, 906 KB
english, 1997
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