Abnormal extracted value of effective channel length for...

Solid-State Electronics 1999 Vol. 43; Iss. 4

Abnormal extracted value of effective channel length for off-set gate MOSFET

Kazuo Terada, Kei-ichi Itoh, Koji Tanaka
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Volume:
43
Year:
1999
Language:
english
Pages:
3
DOI:
10.1016/s0038-1101(98)00318-9
File:
PDF, 145 KB
english, 1999
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