A new method for evaluation of surface recombination in...

A new method for evaluation of surface recombination in heterojunction bipolar transistors by magnetotransport

Tetsuro Nozu, Tohru Sugiyama, Sadato Hongo, Kouhei Morizuka
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Volume:
43
Year:
1999
Language:
english
Pages:
7
DOI:
10.1016/s0038-1101(99)00073-8
File:
PDF, 194 KB
english, 1999
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