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Let dependence of the charge collection efficiency of silicon microdosimeters
Cornelius, I.M., Rosenfeld, A.B., Siegele, R., Cohen, D.D.Volume:
50
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2003.820740
Date:
December, 2003
File:
PDF, 724 KB
english, 2003