Recombination Lifetimes of Iron-Contaminated Silicon Wafers: Characterization Using a Single Set of Capture Cross-Sections
Rommel, M., Zoth, G., Ullrich, M., Ryssel, HeinerVolume:
82-84
Year:
2002
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.82-84.373
File:
PDF, 563 KB
english, 2002