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Application of the reflection–absorption spectroscopy to the semiconductor thin films
J Polit, E.M Sheregii, E Sciesińska, J SciesińskiVolume:
364
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0040-6090(99)00960-8
File:
PDF, 203 KB
english, 2000