Volume 364; Issue 1-2

Thin Solid Films

Volume 364; Issue 1-2
1

Index

Journal:
Thin Solid Films
Year:
2000
File:
PDF, 56 KB
2000
2

Index

Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 83 KB
english, 2000
3

Preface

Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 41 KB
english, 2000
10

Sensitivity of SHG-measurements on oxide deposition process parameters

T Bobek, J Stein, T Dekorsy, H Kurz
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 138 KB
english, 2000
15

Non-destructive optical depth profiling and real-time evaluation of spectroscopic data

M Fried, L Rédei
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 989 KB
english, 2000
16

Defect related photoluminescence of SiGe/Si heterostructures grown by APCVD

J.L Shi, L.K Nanver, K Grimm, C.C.G Visser
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 504 KB
english, 2000
26

In situ characterization of boron nitride layer growth by polarized FTIR reflection spectroscopy

P Scheible, A Lunk
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 247 KB
english, 2000
27

Real-time spectroscopic ellipsometry from 1.5 to 6.5 eV

J.A Zapien, R.W Collins, R Messier
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 279 KB
english, 2000
30

Optical dielectric function of semiconductors

A.B. Djurišić, E.H. Li
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 194 KB
english, 2000
34

VIS/NIR detector based on μc-Si:H p–i–n structures

M Fernandes, A Fantoni, J Martins, A Maçarico, R Schwarz, M Vieira
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 335 KB
english, 2000
36

Reflected optical fourth harmonic generation at crystalline surfaces

Y.-S. Lee, M.C. Downer
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 122 KB
english, 2000
39

Raman and electroreflectance analysis of internal electric fields in ZnSe

V. Wagner, M. Becker, M. Weber, T. Füller, M. Korn, J. Geurts
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 318 KB
english, 2000
44

Time resolved reflectivity measurements of silicon solid phase epitaxial regrowth

M. Bauer, M. Oehme, M. Sauter, G. Eifler, E. Kasper
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 252 KB
english, 2000
46

Applications of optically detected magnetic resonance in semiconductor layered structures

Weimin M. Chen
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 376 KB
english, 2000
48

Ellipsometric analysis of polysilicon layers

B Gruska
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 230 KB
english, 2000
50

Photoluminescence study of AlAs/GaAs superlattices containing enlarged wells

V. Donchev, K. Germanova, N. Shtinkov, I. Ivanov, S. Vlaev
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 121 KB
english, 2000
51

Fabrication and characterization of organic semiconductor-based microcavities

B. Masenelli, S. Callard, A. Gagnaire, J. Joseph
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 233 KB
english, 2000
53

Strain in cubic GaN films versus residual hexagonal GaN content

G Bentoumi, A Deneuville, E Bustarret, B Daudin, G Feuillet
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 255 KB
english, 2000
57

Optical interband spectra and band structure of Ru2Si3 and Ru2Ge3

W. Henrion, M. Rebien, A.G. Birdwell, V.N. Antonov, O. Jepsen
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 401 KB
english, 2000
58

Characterization of oxide layers on GaAs substrates

D.A Allwood, R.T Carline, N.J Mason, C Pickering, B.K Tanner, P.J Walker
Journal:
Thin Solid Films
Year:
2000
Language:
english
File:
PDF, 392 KB
english, 2000