Propagation of Current-Induced Stacking Faults and Forward...

Materials Science Forum 2002 Vol. 389-393

Propagation of Current-Induced Stacking Faults and Forward Voltage Degradation in 4H-SiC PiN Diodes

Stahlbush, Robert E., Fedison, Jeffery B., Arthur, Steve, Rowland, L.B., Kretchmer, James W., Wang, Shao Ping
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Volume:
389-393
Year:
2002
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.389-393.427
File:
PDF, 411 KB
2002
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