Carrier Accumulation in Silicon-On-Insulator Structures...

Solid State Phenomena 2005 Vol. 108-109

Carrier Accumulation in Silicon-On-Insulator Structures Containing Ge Nanocrystals in the Burried SiO2 Layer

Tyschenko, I.E., Frantsuzov, A.A., Naumova, O.V., Fomin, B.I., Nikolaev, D.V., Popov, V.P.
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Volume:
108-109
Year:
2005
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/ssp.108-109.77
File:
PDF, 456 KB
english, 2005
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