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(Invited) Heterogeneous Nano- to Wide-Scale Co-Integration of Beyond-Si and Si CMOS Devices to Enhance Future Electronics
Thean, A., Collaert, N., Radu, I. P., Waldron, N., Merckling, C., Witters, L., Loo, R., Mitard, J., Rooyackers, R., Vandooren, A., Verhulst, A., Veloso, A., Yakimets, D., Bao, T. H., Chiappe, D., VaysVolume:
66
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/06604.0003ecst
Date:
May, 2015
File:
PDF, 2.51 MB
english, 2015