Speckle-Interferometrie mit Diodenlasern zur Formprüfung

tm - Technisches Messen 1998 / 01 Vol. 65; Iss. 3

Speckle-Interferometrie mit Diodenlasern zur Formprüfung

Pfeifer, Tilo, Wegner, Ronny, Mischo, Horst
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Volume:
65
Language:
german
Journal:
tm - Technisches Messen
DOI:
10.1524/teme.1998.65.3.96
Date:
January, 1998
File:
PDF, 2.69 MB
german, 1998
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