Total ionizing dose sensitivity of function blocks in FRAM
Gu, Ke, Liou, J.J., Li, Wei, Liu, Yang, Li, PingVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.03.001
Date:
May, 2015
File:
PDF, 1.67 MB
english, 2015