![](/img/cover-not-exists.png)
Screening small-delay defects using inter-path correlation to reduce reliability risk
García-Gervacio, José L., Nocua, Alejandro, Champac, VictorVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.03.007
Date:
May, 2015
File:
PDF, 1.51 MB
english, 2015