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Application of synchrotron-radiation-based x-ray microprobe techniques for the analysis of recombination activity of metals precipitated at Si/SiGe misfit dislocations
Vyvenko, O F, Buonassisi, T, Istratov, A A, Weber, E R, Kittler, M, Seifert, WVolume:
14
Language:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/0953-8984/14/48/353
Date:
December, 2002
File:
PDF, 552 KB
english, 2002