A study on the microstructure and electrical properties of...

A study on the microstructure and electrical properties of CeO2 thin films for gate dielectric applications

Jung-Ho Yoo, Seok-Woo Nam, Sung-Kwan Kang, Yun-Ha Jeong, Dae-Hong Ko, Ja-Hum Ku, Hoo-Jeong Lee
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Volume:
56
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0167-9317(00)00525-6
File:
PDF, 947 KB
english, 2001
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