Radiation-induced H+ trapping in buried SiO2
K. Vanheusden, J.R. Schwank, W.L. Warren, D.M. Fleetwood, R.A.B. DevineVolume:
36
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0167-9317(97)00056-7
File:
PDF, 332 KB
english, 1997