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Influences of the different degradation mechanisms in AC-stressed p-MOSFET's during pass transistor operation
A. Bravaix, D. Goguenheim, D. Vuillaume, N. Revil, M. Varrot, P. MortiniVolume:
36
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0167-9317(97)00069-5
File:
PDF, 309 KB
english, 1997