Technology for nanoelectronic devices based on ultra-high vacuum scanning tunneling microscopy on the Si(100) surface
G. Palasantzas, B. Ilge, S. Rogge, L.J. GeerligsVolume:
46
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0167-9317(99)00035-0
File:
PDF, 1.37 MB
english, 1999