ON-state Reliability of Cu Atom Switch Under Current–Temperature Stress
Tada, Munehiro, Okamoto, Koichiro, Sakamoto, Toshitsugu, Hada, HiromitsuVolume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2451139
Date:
September, 2015
File:
PDF, 3.68 MB
english, 2015