Is atomic-scale dissipation in NC-AFM real? Investigation using virtual atomic force microscopy
Trevethan, T, Kantorovich, L, Polesel-Maris, J, Gauthier, SVolume:
18
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/18/8/084017
Date:
February, 2007
File:
PDF, 680 KB
english, 2007