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Volume 18; Issue 8
Main
Nanotechnology
Volume 18; Issue 8
Nanotechnology
Volume 18; Issue 8
1
Surface potential investigation on single wall carbon nanotubes by Kelvin probe force microscopy and atomic force microscope potentiometry
Miyato, Yuji
,
Kobayashi, Kei
,
Matsushige, Kazumi
,
Yamada, Hirofumi
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 495 KB
Your tags:
english, 2007
2
Global standardization of scanning probe microscopy
Fujita, Daisuke
,
Itoh, Hiroshi
,
Ichimura, Shingo
,
Kurosawa, Tomizo
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 960 KB
Your tags:
english, 2007
3
Japan AFM roadmap 2006
Morita, Seizo
,
Yamada, Hirofumi
,
Ando, Toshio
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 1.06 MB
Your tags:
english, 2007
4
Direct observation of the vacancy site of the iron silicide c(4 × 8) phase using frequency modulation atomic force microscopy
Sugimoto, Y
,
Abe, M
,
Konoshita, S
,
Morita, S
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 1.58 MB
Your tags:
english, 2007
5
Local work function analysis of Pt/TiO 2 photocatalyst by a Kelvin probe force microscope
Hiehata, K
,
Sasahara, A
,
Onishi, H
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 84 KB
Your tags:
english, 2007
6
Atomic contrast on a point defect on CaF 2 (111) imaged by non-contact atomic force microscopy
Fujii, Shintaro
,
Fujihira, Masamichi
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 1.15 MB
Your tags:
english, 2007
7
Kelvin probe force microscopy of C 60 on metal substrates: towards molecular resolution
Zerweck, U
,
Loppacher, Ch
,
Otto, T
,
Grafström, S
,
Eng, L M
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 922 KB
Your tags:
english, 2007
8
Imaging of soft matter with tapping-mode atomic force microscopy and non-contact-mode atomic force microscopy
Yang, Chih-Wen
,
Hwang, Ing-Shouh
,
Chen, Yen Fu
,
Chang, Chia Seng
,
Tsai, Din Ping
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 1.31 MB
Your tags:
english, 2007
9
Resolution enhancement in contact-type scanning nonlinear dielectric microscopy using a conductive carbon nanotube probe tip
Ishikawa, Kenya
,
Honda, Koichiro
,
Cho, Yasuo
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 1.10 MB
Your tags:
english, 2007
10
Is atomic-scale dissipation in NC-AFM real? Investigation using virtual atomic force microscopy
Trevethan, T
,
Kantorovich, L
,
Polesel-Maris, J
,
Gauthier, S
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 680 KB
Your tags:
english, 2007
11
Molecular resolution in dynamic force microscopy: topography and dissipation for weakly interacting systems
Fendrich, M
,
Kunstmann, T
,
Paulkowski, D
,
Möller, R
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 683 KB
Your tags:
english, 2007
12
Sequential and parallel patterning by local chemical nanolithography
Martinez, R V
,
Losilla, N S
,
Martinez, J
,
Tello, M
,
Garcia, R
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 895 KB
Your tags:
english, 2007
13
NC-AFM 2006: Proceedings of the 9th International Conference on Non-contact Atomic Force Microscopy
Onishi, Masahiko Tomitori and Hiroshi
Journal:
Nanotechnology
Year:
2007
Language:
english
File:
PDF, 34 KB
Your tags:
english, 2007
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