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Fermi level-dependent defect formation at Cu(In,Ga)Se2 interfaces
A. Klein, J. Fritsche, W. Jaegermann, J.H. Schön, Ch. Kloc, E. BucherVolume:
166
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0169-4332(00)00484-0
File:
PDF, 109 KB
english, 2000