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High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique
Shinichi Kitamura, Katsuyuki Suzuki, Masashi IwatsukiVolume:
140
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0169-4332(98)00538-8
File:
PDF, 1.15 MB
english, 1999