Volume 140; Issue 3-4

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Applied Surface Science
Volume 140; Issue 3-4

Applied Surface Science

Volume 140; Issue 3-4

1

Editorial

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 8 KB

english, 1999

2

The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscope

S Orisaka, T Minobe, T Uchihashi, Y Sugawara, S Morita

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 257 KB

english, 1999

3

Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001)

W Allers, A Schwarz, U.D Schwarz, R Wiesendanger

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 1.83 MB

english, 1999

4

Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy

L.M Eng, M Bammerlin, Ch Loppacher, M Guggisberg, R Bennewitz, R Lüthi, E Meyer, H.-J Güntherodt

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 2.19 MB

english, 1999

5

Imaging of atomic-scale structure of oxide surfaces and adsorbed molecules by noncontact atomic force microscopy

Ken-ichi Fukui, Hiroshi Onishi, Yasuhiro Iwasawa

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 398 KB

english, 1999

6

High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope technique

Shinichi Kitamura, Katsuyuki Suzuki, Masashi Iwatsuki

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 1.15 MB

english, 1999

7

Non-contact atomic force microscopy imaging of TiO2(100) surfaces

H Raza, C.L Pang, S.A Haycock, G Thornton

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 1.68 MB

english, 1999

8

Contrast inversion in dynamic force microscopy on silicon(111) 7×7 and gold(111) 23×3

Susanne Molitor, Peter Güthner, Thomas Berghaus

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 3.26 MB

english, 1999

9

Investigations of C60 molecules deposited on Si(111) by noncontact atomic force microscopy

Kei Kobayashi, Hirofumi Yamada, Toshihisa Horiuchi, Kazumi Matsushige

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 555 KB

english, 1999

10

Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques

Ch. Loppacher, M. Bammerlin, M. Guggisberg, F. Battiston, R. Bennewitz, S. Rast, A. Baratoff, E. Meyer, H.-J. Güntherodt

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 487 KB

english, 1999

11

Simultaneous imaging of the In and As sublattice on InAs(110)-(1×1) with dynamic scanning force microscopy

A Schwarz, W Allers, U.D Schwarz, R Wiesendanger

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 413 KB

english, 1999

12

Imaging of chemical reactivity and buckled dimers on Si(100)2×1 reconstructed surface with noncontact AFM

T. Uchihashi, Y. Sugawara, T. Tsukamoto, T. Minobe, S. Orisaka, T. Okada, S. Morita

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 281 KB

english, 1999

13

Off resonance ac mode force spectroscopy and imaging with an atomic force microscope

S.P. Jarvis, M.A. Lantz, U. Dürig, H. Tokumoto

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 280 KB

english, 1999

14

Determination of tip–sample interaction forces from measured dynamic force spectroscopy curves

B. Gotsmann, B. Anczykowski, C. Seidel, H. Fuchs

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 178 KB

english, 1999

15

Chemical interactions in noncontact AFM on semiconductor surfaces: Si(111), Si(100) and GaAs(110)

Rubén Pérez, Ivan Štich, Michael C. Payne, Kiyoyuki Terakura

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 141 KB

english, 1999

16

Contrast mechanism in non-contact SFM imaging of ionic surfaces

Alexander I. Livshits, Alexander L. Shluger, Andrew L. Rohl

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 443 KB

english, 1999

17

Relationship between the non linear dynamic behaviour of an oscillating tip–microlever system and the contrast at the atomic scale

J.P. Aimé, G. Couturier, R. Boisgard, L. Nony

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 102 KB

english, 1999

18

Theory for the effect of the tip–surface interaction potential on atomic resolution in forced vibration system of noncontact AFM

Naruo Sasaki, Masaru Tsukada

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 450 KB

english, 1999

19

Calculation of the frequency shift in dynamic force microscopy

H. Hölscher, U.D. Schwarz, R. Wiesendanger

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 229 KB

english, 1999

20

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Franz J. Giessibl, Hartmut Bielefeldt, Stefan Hembacher, Jochen Mannhart

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 110 KB

english, 1999

21

Force spectroscopy in noncontact mode

I.Yu Sokolov, G.S Henderson, F.J Wicks

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 104 KB

english, 1999

22

Pseudo-non-contact AFM imaging?

I.Yu Sokolov, G.S Henderson, F.J Wicks

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 124 KB

english, 1999

23

Possibility of measuring exchange force through force microscopy

K Nakamura, T Oguchi, H Hasegawa, K Sueoka, K Hayakawa, K Mukasa

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 154 KB

english, 1999

24

True atomic resolution imaging of surface structure and surface charge on the GaAs(110)

Yasuhiro Sugawara, Takayuki Uchihashi, Masayuki Abe, Seizo Morita

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 788 KB

english, 1999

25

How to measure energy dissipation in dynamic mode atomic force microscopy

B. Anczykowski, B. Gotsmann, H. Fuchs, J.P. Cleveland, V.B. Elings

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 549 KB

english, 1999

26

Near-field optical imaging using force detection with new tip-electrode geometry

M. Abe, Y. Sugawara, K. Sawada, Y. Andoh, S. Morita

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 196 KB

english, 1999

27

Nano-optical image and probe in a scanning near-field optical microscope

Sumio Hosaka, Toshimichi Shintani, Atsushi Kikukawa, Kenchi Itoh

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 703 KB

english, 1999

28

Semiconductor acousto-electric potential detection using a force microscope

Atsushi Kikukawa, Sumio Hosaka

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 190 KB

english, 1999

29

Observation of single- and double-stranded DNA using non-contact atomic force microscopy

Y. Maeda, T. Matsumoto, T. Kawai

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 320 KB

english, 1999

30

Guidelines for the achievement of true atomic resolution with noncontact atomic force microscopy

Seizo Morita, Yasuhiro Sugawara

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 94 KB

english, 1999

31

The electrostatic contribution to the long-range interactions between tungsten and oxide surfaces under ultrahigh vacuum

S. Sounilhac, E. Barthel, F. Creuzet

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 89 KB

english, 1999

32

Apparent contrast of molecularly thin films of water at ionic crystal surfaces

K. Miura, T. Yamada, M. Ishikawa, S. Okita

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 785 KB

english, 1999

33

Lead zirconate titanate cantilever for noncontact atomic force microscopy

Y Miyahara, T Fujii, S Watanabe, A Tonoli, S Carabelli, H Yamada, H Bleuler

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 70 KB

english, 1999

34

Imitation of non-contact mode while scanning in the presence of an electric double layer?

I.Yu. Sokolov, G.S. Henderson, F.J. Wicks

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 3.60 MB

english, 1999

35

Tip cleaning and sharpening processes for noncontact atomic force microscope in ultrahigh vacuum

Masahiko Tomitori, Toyoko Arai

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 422 KB

english, 1999

36

Index

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 48 KB

english, 1999

37

Index

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 79 KB

english, 1999

38

Distance dependence of noncontact-AFM image contrast on Si(111)3×3–Ag structure

Tetsuya Minobe, Takayuki Uchihashi, Takahiro Tsukamoto, Shigeki Orisaka, Yasuhiro Sugawara, Seizo Morita

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 497 KB

english, 1999

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