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Formation of a denuded zone in nitrogen-doped Czochralski silicon wafer treated by ramping anneals
Gong, Longfei, Ma, Xiangyang, Tian, Daxi, Fu, Liming, Yang, DerenVolume:
20
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/20/2/022
Date:
February, 2005
File:
PDF, 468 KB
english, 2005